Found 3 results
Filters: Author is Thomas J. E. Schwarz  [Clear All Filters]
B. Hong, Schwarz, T. J. E., Brandt, S., and Long, D. D. E., Reliability of MEMS-Based Storage Enclosures, in MASCOTS '04: Proceedings of the The IEEE Computer Society's 12th Annual International Symposium on Modeling, Analysis, and Simulation of Computer and Telecommunications Systems, Washington, DC, USA, 2004, pp. 571–579.
Q. Xin, Miller, E. L., Schwarz, T. J. E., Long, D. D. E., Brandt, S., and Litwin, W., Reliability Mechanisms for Very Large Storage Systems, in MSS '03: Proceedings of the 20 th IEEE/11 th NASA Goddard Conference on Mass Storage Systems and Technologies (MSS'03), Washington, DC, USA, 2003, p. 146.